Extended Matrix Region Selection Code: An ECC for adjacent Multiple Cell Upset in memory arrays
Felipe Gaspar SILVEIRA, J. FREITAS JR., W. C. ; MICROELECTRONICS RELIABILITY; 2020; 10.1016/j.microrel.2020.113582
Felipe Gaspar SILVEIRA, J. FREITAS JR., W. C. ; MICROELECTRONICS RELIABILITY; 2020; 10.1016/j.microrel.2020.113582